Design and Synthesis of Built-in Self-testable Two-dimensional Discrete Cosine Transform Circuits
نویسندگان
چکیده
We present design of a two-dimensional (2-D) discrete cosine transform (DCT) circuit with built-in self-test (BIST) capability. After modifying an existing fast 2-D DCT algorithm to make it more flexible, we synthesized the data path and the controller using our high-level BIST synthesis tool and incorporated scan design to other modules. Our design achieves high fault coverage at small cost of area overhead and system performance degradation.
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